{"id":3,"date":"2021-06-09T14:39:02","date_gmt":"2021-06-09T14:39:02","guid":{"rendered":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/homepage\/"},"modified":"2021-06-11T15:35:59","modified_gmt":"2021-06-11T15:35:59","slug":"homepage","status":"publish","type":"page","link":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/","title":{"rendered":"Home Page"},"content":{"rendered":"<p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-medium wp-image-28\" src=\"https:\/\/cdn-dev.vanderbilt.edu\/t2-my-dev\/wp-content\/uploads\/sites\/3418\/2021\/06\/VU-Chess-photo-300x225.jpg\" alt=\"VU Chess photo\" width=\"300\" height=\"225\" srcset=\"https:\/\/cdn-dev.vanderbilt.edu\/t2-my-dev\/wp-content\/uploads\/sites\/3418\/2021\/06\/VU-Chess-photo-300x225.jpg 300w, https:\/\/cdn-dev.vanderbilt.edu\/t2-my-dev\/wp-content\/uploads\/sites\/3418\/2021\/06\/VU-Chess-photo-768x576.jpg 768w, https:\/\/cdn-dev.vanderbilt.edu\/t2-my-dev\/wp-content\/uploads\/sites\/3418\/2021\/06\/VU-Chess-photo.jpg 960w\" sizes=\"auto, (max-width: 300px) 100vw, 300px\" \/><br \/>\n<strong>Landreth Professor<br \/>\nElectrical Engineering &amp; Computer Science Department<br \/>\nVanderbilt University<\/strong><\/p>\n<p>Research Group: <a href=\"http:\/\/www.isde.vanderbilt.edu\/\">Radiation Effects and Reliability Group\/Institute for Space and Defense Electronics<\/a> at Vanderbilt University<\/p>\n<p>Research Interests: Effects of ionizing radiation on microelectronic devices &amp; materials.<br \/>\nOrigin(s) of 1\/f noise in semiconductors, semiconductor devices, and metals.<br \/>\nDefects, reliability, radiation response of SiC, GaN, and other compound semiconductor devices<br \/>\nRadiation hardness assurance test methods.<br \/>\nCharge trapping in silicon dioxide, and interface-trap generation.<br \/>\nRadiation effects modeling and simulation.<br \/>\nNovel microelectronic materials, including silicon-on-insulator materials.<br \/>\nElectronics for high-radiation and high-temperature environments.<br \/>\nAdvanced microelectronic processing\/characterization, including ultrathin oxides &amp; alternative dielectrics.<br \/>\nThermally stimulated current methods to profile defects in insulators.<\/p>\n<p><strong>Education: Ph. D., Solid State Physics, Purdue University, May 1984<br \/>\nM. S., Experimental Physics, Purdue University, August 1981<br \/>\nB. S., Physics and Applied Math, Purdue University, May 1980<\/strong><\/p>\n<p><strong>Contact Information:<br \/>\nPostal<\/strong><br \/>\nVanderbilt University<br \/>\nVU Station B #351824<br \/>\n2301 Vanderbilt Place<br \/>\nNashville, TN 37235<\/p>\n<p><strong>Courier<\/strong><br \/>\nVanderbilt University<br \/>\n400 24th Ave. S.<br \/>\nFeatheringill Hall, Room 328<br \/>\nNashville, TN 37212<\/p>\n<p>Phone (615) 322-2498<br \/>\nFax (615) 343-6702<\/p>\n<p><strong>E-mail (Vanderbilt)<\/strong> dan.fleetwood@vanderbilt.edu<br \/>\n<strong>E-mail (Home)<\/strong> dmfleet@aol.com<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Landreth Professor Electrical Engineering &amp; Computer Science Department Vanderbilt University Research Group: Radiation Effects and Reliability Group\/Institute for Space and Defense Electronics at Vanderbilt University Research Interests: Effects of ionizing radiation on microelectronic devices &amp; materials. Origin(s) of 1\/f noise in semiconductors, semiconductor devices, and metals. Defects, reliability, radiation response of SiC, GaN, and other&#8230;<\/p>\n","protected":false},"author":637,"featured_media":28,"parent":4,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"tags":[],"class_list":["post-3","page","type-page","status-publish","has-post-thumbnail","hentry"],"_links":{"self":[{"href":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/wp-json\/wp\/v2\/pages\/3","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/wp-json\/wp\/v2\/users\/637"}],"replies":[{"embeddable":true,"href":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/wp-json\/wp\/v2\/comments?post=3"}],"version-history":[{"count":11,"href":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/wp-json\/wp\/v2\/pages\/3\/revisions"}],"predecessor-version":[{"id":34,"href":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/wp-json\/wp\/v2\/pages\/3\/revisions\/34"}],"up":[{"embeddable":true,"href":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/wp-json\/wp\/v2\/pages\/4"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/wp-json\/wp\/v2\/media\/28"}],"wp:attachment":[{"href":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/wp-json\/wp\/v2\/media?parent=3"}],"wp:term":[{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/my.dev.vanderbilt.edu\/danfleetwood\/wp-json\/wp\/v2\/tags?post=3"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}