{"id":6,"date":"2011-07-31T01:37:42","date_gmt":"2011-07-31T01:37:42","guid":{"rendered":"https:\/\/my.dev.vanderbilt.edu\/briansierawski\/publications\/"},"modified":"2017-02-03T12:16:28","modified_gmt":"2017-02-03T17:16:28","slug":"publications","status":"publish","type":"page","link":"https:\/\/my.dev.vanderbilt.edu\/briansierawski\/publications\/","title":{"rendered":"Publications"},"content":{"rendered":"

Reviewed<\/h3>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
[<\/a>47]<\/td>\nE.\u00a0B. Pitt, E.\u00a0J. Barth, Z.\u00a0J. Diggins, N.\u00a0Mahadevan, G.\u00a0Karsai, B.\u00a0D. Sierawski<\/span>, R.\u00a0A. Reed, R.\u00a0D. Schrimpf, R.\u00a0A. Weller, M.\u00a0L. Alles, and A.\u00a0F. Witulski, \u201cRadiation response and adaptive control-based degradation mitigation of mems accelerometers in ionizing dose environments,\u201d IEEE Sensors J.<\/em>, vol.\u00a017, no.\u00a04, pp. 1132–1143, Feb. 2017.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>46]<\/td>\nJ.\u00a0M. Trippe, R.\u00a0A. Reed, B.\u00a0D. Sierawski<\/u>, R.\u00a0A. Weller, R.\u00a0A. Austin, L.\u00a0W. Massengill, B.\u00a0L. Bhuva, K.\u00a0M. Warren, and B.\u00a0Narasimham, \u201cPredicting the vulnerability of memories to muon-induced seus with low-energy proton tests informed by monte carlo simulations,\u201d in Proc. of the Int. Rel. Physics Symp.<\/em>, Apr. 2016, pp. SE–6–1–SE–6–6.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>45]<\/td>\nB.\u00a0D. Sierawski<\/u>, K.\u00a0M. Warren, A.\u00a0L. Sternberg, R.\u00a0A. Austin, J.\u00a0M. Trippe, M.\u00a0W. McCurdy, R.\u00a0A. Reed, R.\u00a0A. Weller, M.\u00a0L. Alles, R.\u00a0D. Schrimpf, L.\u00a0W. Massengill, D.\u00a0M. Fleetwood, A.\u00a0Monteiro, G.\u00a0W. Buxton, J.\u00a0C. Brandenburg, W.\u00a0B. Fisher, and R.\u00a0Davis, \u201cCubesats and crowd-sourced monitoring for single event effects hardness assurance,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a0PP, no.\u00a099, pp. 1–1, 2016.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>44]<\/td>\nZ.\u00a0J. Diggins, N.\u00a0Mahadevan, E.\u00a0B. Pitt, D.\u00a0Herbison, R.\u00a0M. Hood, G.\u00a0Karsai, B.\u00a0D. Sierawski<\/u>, E.\u00a0J. Barth, R.\u00a0A. Reed, R.\u00a0D. Schrimpf, R.\u00a0A. Weller, M.\u00a0L. Alles, and A.\u00a0F. Witulski, \u201cBayesian inference modeling of total ionizing dose effects on system performance,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a062, no.\u00a06, pp. 2517–2524, Dec. 2015.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>43]<\/td>\nJ.\u00a0M. Trippe, R.\u00a0A. Reed, R.\u00a0A. Austin, B.\u00a0D. Sierawski<\/u>, R.\u00a0A. Weller, E.\u00a0D. Funkhouser, M.\u00a0P. King, B.\u00a0Narasimham, B.\u00a0Bartz, R.\u00a0Baumann, J.\u00a0Labello, J.\u00a0Nichols, R.\u00a0D. Schrimpf, and S.\u00a0L. Weeden-Wright, \u201cElectron-induced single event upsets in 28nm and 45nm bulk SRAMs,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a062, no.\u00a06, pp. 2709–2716, Dec. 2015.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>42]<\/td>\nN.\u00a0A. Dodds, M.\u00a0J. Martinez, P.\u00a0E. Dodd, M.\u00a0R. Shaneyfelt, F.\u00a0W. Sexton, J.\u00a0D. Black, D.\u00a0S. Lee, S.\u00a0E. Swanson, B.\u00a0L. Bhuva, K.\u00a0M. Warren, R.\u00a0A. Reed, J.\u00a0Trippe, B.\u00a0D. Sierawski<\/u>, R.\u00a0A. Weller, N.\u00a0Mahatme, N.\u00a0J. Gaspard, T.\u00a0Assis, R.\u00a0Austin, S.\u00a0L. Weeden-Wright, L.\u00a0W. Massengill, G.\u00a0Swift, M.\u00a0Wirthlin, M.\u00a0Cannon, R.\u00a0Liu, L.\u00a0Chen, A.\u00a0T. Kelly, P.\u00a0W. Marshall, M.\u00a0Trinczek, E.\u00a0W. Blackmore, S.\u00a0J. Wen, R.\u00a0Wong, B.\u00a0Narasimham, J.\u00a0A. Pellish, and H.\u00a0Puchner, \u201cThe contribution of low-energy protons to the total on-orbit SEU rate,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a062, no.\u00a06, pp. 2440–2451, Dec. 2015, IEEE Nuclear and Space Radiation Effects Conference (NSREC) Outstanding Conference Paper Award.<\/span>[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>41]<\/td>\nS.\u00a0L. Weeden-Wright, M.\u00a0P. King, N.\u00a0C. Hooten, W.\u00a0G. Bennett, B.\u00a0D. Sierawski<\/u>, R.\u00a0D. Schrimpf, R.\u00a0A. Weller, R.\u00a0A. Reed, M.\u00a0H. Mendenhall, D.\u00a0M. Fleetwood, M.\u00a0L. Alles, and R.\u00a0C. Baumann, \u201cEffects of energy-deposition variability on soft error rate prediction,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a062, no.\u00a05, pp. 2181–2186, Oct. 2015.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>40]<\/td>\nR.\u00a0A. Reed, R.\u00a0A. Weller, M.\u00a0H. Mendenhall, D.\u00a0M. Fleetwood, K.\u00a0M. Warren, B.\u00a0D. Sierawski<\/u>, M.\u00a0P. King, R.\u00a0D. Schrimpf, and E.\u00a0C. Auden, \u201cPhysical processes and applications of the monte carlo radiative energy deposition (MRED) code,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a062, no.\u00a04, pp. 1441–1461, Aug. 2015.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>39]<\/td>\nZ.\u00a0J. Diggins, N.\u00a0Mahadevan, E.\u00a0B. Pitt, D.\u00a0Herbison, G.\u00a0Karsai, B.\u00a0D. Sierawski<\/span>, E.\u00a0J. Barth, R.\u00a0A. Reed, R.\u00a0D. Schrimpf, R.\u00a0A. Weller, M.\u00a0L. Alles, and A.\u00a0Witulski, \u201cSystem health awareness in total-ionizing dose environments,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a062, no.\u00a04, pp. 1674–1681, Aug. 2015.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>38]<\/td>\nZ.\u00a0J. Diggins, N.\u00a0Mahadevan, D.\u00a0Herbison, G.\u00a0Karsai, B.\u00a0D. Sierawski<\/u>, E.\u00a0J. Barth, E.\u00a0B. Pitt, R.\u00a0A. Reed, R.\u00a0D. Schrimpf, R.\u00a0A. Weller, M.\u00a0L. Alles, and A.\u00a0Witulski, \u201cTotal-ionizing-dose induced timing window violations in CMOS microcontrollers,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a061, no.\u00a06, pp. 2979–2984, Dec. 2014.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>37]<\/td>\nJ.\u00a0H. Adams, R.\u00a0A. Weller, R.\u00a0A. Reed, B.\u00a0D. Sierawski<\/u>, and M.\u00a0H. Mendenhall, \u201cModel of radiation effects on electronics (MREE),\u201d NASA Tech Briefs Magazine: Software Supplement<\/em>, vol.\u00a038, no.\u00a09, p.\u00a015, Sep. 2014.[\u00a0bib<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>36]<\/td>\nB.\u00a0D. Sierawski<\/u>, B.\u00a0Bhuva, R.\u00a0Reed, N.\u00a0Tam, B.\u00a0Narasimham, K.\u00a0Ishida, A.\u00a0Hillier, M.\u00a0Trinczek, E.\u00a0Blackmore, S.-J. Wen, and R.\u00a0Wong, \u201cBias dependence of muon-induced single event upsets in 28 nm static random access memories,\u201d in Proc. of the Int. Rel. Physics Symp.<\/em>, Jun. 2014, pp. 2B.2.1–2B.2.5.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>35]<\/td>\nM.\u00a0P. King, R.\u00a0A. Reed, R.\u00a0A. Weller, M.\u00a0H. Mendenhall, R.\u00a0D. Schrimpf, B.\u00a0D. Sierawski<\/span>, A.\u00a0L. Sternberg, B.\u00a0Narasimham, J.\u00a0K. Wang, E.\u00a0Pitta, B.\u00a0Bartz, D.\u00a0Reed, C.\u00a0Monzel, R.\u00a0C. Baumann, X.\u00a0Deng, J.\u00a0A. Pellish, M.\u00a0D. Berg, C.\u00a0M. Seidleck, E.\u00a0C. Auden, S.\u00a0L. Weeden-Wright, N.\u00a0J. Gaspard, C.\u00a0Zhang, and D.\u00a0M. Fleetwood, \u201cElectron-induced single-event upsets in static random access memory,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a060, no.\u00a06, pp. 4122–4129, Dec. 2013, IEEE Nuclear and Space Radiation Effects Conference (NSREC) Outstanding Conference Paper Award, Outstanding Student Paper Award.<\/span>[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>34]<\/td>\nJ.\u00a0H. Adams, A.\u00a0F. Barghouty, M.\u00a0H. Mendenhall, R.\u00a0A. Reed, B.\u00a0D. Sierawski<\/u>, K.\u00a0M. Warren, J.\u00a0W. Watts, and R.\u00a0A. Weller, \u201cCR\u00c8ME: The 2011 revision of the cosmic ray effects on micro-electronics code,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a059, no.\u00a06, pp. 3141–3147, 2012.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>33]<\/td>\nF.\u00a0El-Mamouni, E.\u00a0X. Zhang, D.\u00a0R. Ball, B.\u00a0D. Sierawski<\/u>, M.\u00a0P. King, R.\u00a0D. Schrimpf, R.\u00a0A. Reed, M.\u00a0L. Alles, D.\u00a0M. Fleetwood, D.\u00a0Linten, E.\u00a0Simoen, and G.\u00a0Vizkelethy, \u201cHeavy-ion-induced current transients in bulk and SOI FinFETs,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a059, no.\u00a06, pp. 2674–2681, 2012.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>32]<\/td>\nJ.\u00a0Chetia, B.\u00a0D. Sierawski<\/u>, A.\u00a0L. Sternberg, A.\u00a0A. Adeleke, B.\u00a0L. Bhuva, and L.\u00a0W. Massengill, \u201cAn efficient AVF estimation technique using circuit partitioning,\u201d in Proc. of the Conf. on Rad. Effects. on Comp. and Sys.<\/em>, Sep. 2011, pp. 507–510.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>31]<\/td>\nR.\u00a0Garcia, E.\u00a0J. Daly, H.\u00a0D.\u00a0R. Evans, P.\u00a0Nieminen, G.\u00a0Santin, B.\u00a0D. Sierawski<\/u>, and M.\u00a0H. Mendenhall, \u201cCombined use of heavy ion and proton test data in the determination of a GaAs power MESFET critical charge and sensitive depth,\u201d in Proc. of the Conf. on Rad. Effects. on Comp. and Sys.<\/em>, Sep. 2011, pp. 244–251.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>30]<\/td>\n——, \u201cCalibration of the weighed sensitive volume model to heavy ion experimental data,\u201d in Proc. of the Conf. on Rad. Effects. on Comp. and Sys.<\/em>, Sep. 2011, pp. 60–66.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>29]<\/td>\nB.\u00a0D. Sierawski<\/u>, R.\u00a0A. Reed, M.\u00a0H. Mendenhall, R.\u00a0A. Weller, R.\u00a0D. Schrimpf, S.-J. Wen, R.\u00a0Wong, N.\u00a0Tam, and R.\u00a0C. Baumann, \u201cEffects of scaling on muon-induced soft errors,\u201d in Proc. of the Int. Rel. Physics Symp.<\/em>, Apr. 2011, pp. 3C.3.1 –3C.3.6, IEEE International Reliability Physics Symposium Best Student Talk Award.<\/span>[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>28]<\/td>\nM.\u00a0A. Clemens, B.\u00a0D. Sierawski<\/u>, K.\u00a0M. Warren, M.\u00a0H. Mendenhall, N.\u00a0A. Dodds, R.\u00a0A. Weller, R.\u00a0A. Reed, P.\u00a0E. Dodd, M.\u00a0R. Shaneyfelt, J.\u00a0R. Schwank, S.\u00a0A. Wender, and R.\u00a0C. Baumann, \u201cThe effects of neutron energy and high-z materials on single event upsets and multiple cell upsets,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a058, no.\u00a06, pp. 2591–2598, 2011.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>27]<\/td>\nM.\u00a0L. Alles, R.\u00a0D. Schrimpf, R.\u00a0A. Reed, L.\u00a0W. Massengill, R.\u00a0A. Weller, M.\u00a0H. Mendenhall, D.\u00a0R. Ball, K.\u00a0M. Warren, T.\u00a0D. Loveless, J.\u00a0S. Kauppila, and B.\u00a0D. Sierawski<\/u>, \u201cRadiation hardness of FDSOI and FinFET technologies,\u201d in Proc. of the SOI Conf.<\/em>, 2011, pp. 1–2.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>26]<\/td>\nK.\u00a0Warren, R.\u00a0Reed, R.\u00a0Weller, M.\u00a0Mendenhall, B.\u00a0Sierawski<\/span>, and R.\u00a0Schrimpf, \u201cApplications of monte carlo radiation transport simulation techniques for predicting single event effects in microelectronics,\u201d AIP Conference Proceedings<\/em>, vol. 1336, no.\u00a01, pp. 643–648, 2011.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>25]<\/td>\nB.\u00a0D. Sierawski<\/u>, M.\u00a0H. Mendenhall, R.\u00a0A. Reed, M.\u00a0A. Clemens, R.\u00a0A. Weller, R.\u00a0D. Schrimpf, E.\u00a0W. Blackmore, M.\u00a0Trinczek, B.\u00a0Hitti, J.\u00a0A. Pellish, R.\u00a0C. Baumann, S.-J. Wen, R.\u00a0Wong, and N.\u00a0Tam, \u201cMuon-induced single event upsets in deep-submicron technology,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a057, no.\u00a06, pp. 3273–3278, Dec. 2010, IEEE Nuclear and Space Radiation Effects Conference (NSREC) Outstanding Conference Paper Award Nominee.<\/span>[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>24]<\/td>\nB.\u00a0Narasimham, J.\u00a0K. Wang, M.\u00a0Buer, R.\u00a0Gorti, K.\u00a0Chandrasekharan, K.\u00a0M. Warren, B.\u00a0D. Sierawski<\/u>, R.\u00a0D. Schrimpf, R.\u00a0A. Reed, and R.\u00a0A. Weller, \u201cContribution of control logic upsets and multi-node charge collection to flip-flop SEU cross-section in 40-nm CMOS,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a057, no.\u00a06, pp. 3176–3182, Dec. 2010.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>23]<\/td>\nA.\u00a0Dasgupta, D.\u00a0M. Fleetwood, R.\u00a0A. Reed, R.\u00a0W. Weller, M.\u00a0H. Mendenhall, and B.\u00a0D. Sierawski<\/u>, \u201cDose enhancement and reduction in SiO2 and High-K MOS insulators,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a057, no.\u00a06, pp. 3463–3469, Dec. 2010.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>22]<\/td>\nJ.\u00a0A. Pellish, M.\u00a0A. Xapsos, K.\u00a0A. LaBel, P.\u00a0W. Marshall, D.\u00a0F. Heidel, K.\u00a0P. Rodbell, M.\u00a0C. Hakey, P.\u00a0E. Dodd, M.\u00a0R. Shaneyfelt, J.\u00a0R. Schwank, R.\u00a0C. Baumann, X.\u00a0Deng, A.\u00a0Marshall, B.\u00a0D. Sierawski<\/u>, J.\u00a0D. Black, R.\u00a0A. Reed, R.\u00a0D. Schrimpf, H.\u00a0S. Kim, M.\u00a0D. Berg, M.\u00a0J. Campola, M.\u00a0R. Friendlich, C.\u00a0E. Perez, A.\u00a0M. Phan, and C.\u00a0M. Seidleck, \u201cHeavy ion testing with iron at 1 GeV\/amu,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a057, no.\u00a05, pp. 2948–2954, Oct. 2010, RADECS Meritorius Paper.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>21]<\/td>\nR.\u00a0A. Weller, M.\u00a0H. Mendenhall, R.\u00a0A.Reed, R.\u00a0D. Schrimpf, K.\u00a0M. Warren, B.\u00a0D. Sierawski, and L.\u00a0W. Massengill, \u201cMonte carlo simulation of single event effects,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a057, no.\u00a04, pp. 1726–1746, Aug. 2010.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>20]<\/td>\nB.\u00a0D. Sierawski<\/u>, K.\u00a0M. Warren, R.\u00a0A. Reed, R.\u00a0A. Weller, M.\u00a0H. Mendenhall, R.\u00a0D. Schrimpf, R.\u00a0C. Baumann, and V.\u00a0Zhu, \u201cContribution of low-energy ( < 10 mev) neutrons to upset rate in a 65 nm SRAM,\u201d in Proc. of the Int. Rel. Physics Symp.<\/em>, May 2010, pp. 395–399.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>19]<\/td>\nV.\u00a0B. Sheshadri, B.\u00a0L. Bhuva, R.\u00a0A. Reed, R.\u00a0A. Weller, M.\u00a0H. Mendenhall, R.\u00a0D. Schrimpf, K.\u00a0M. Warren, B.\u00a0D. Sierawski<\/u>, S.-J. Wen, and R.\u00a0Wong, \u201cEffects of multi-node charge collection in flip-flop designs at advanced technology nodes,\u201d in Proc. of the Int. Rel. Physics Symp.<\/em>, May 2010, pp. 1026–1030.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>18]<\/td>\nB.\u00a0D. Sierawski<\/u>, J.\u00a0A. Pellish, R.\u00a0A. Reed, R.\u00a0D. Schrimpf, R.\u00a0A. Weller, M.\u00a0H. Mendenhall, J.\u00a0D. Black, A.\u00a0D. Tipton, M.\u00a0A. Xapsos, R.\u00a0C. Baumann, X.\u00a0Deng, M.\u00a0R. Friendlich, H.\u00a0S. Kim, A.\u00a0M. Phan, and C.\u00a0M. Seidleck, \u201cImpact of low-energy proton induced upsets on test methods and rate predictions,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a056, no.\u00a06, pp. 3085–3092, Dec. 2009, IEEE Nuclear and Space Radiation Effects Conference (NSREC) Outstanding Conference Paper Award Nominee.<\/span>[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>17]<\/td>\nR.\u00a0A. Weller, R.\u00a0A. Reed, K.\u00a0M. Warren, M.\u00a0H. Mendenhall, B.\u00a0D. Sierawski<\/u>, R.\u00a0D. Schrimpf, and L.\u00a0W. Massengill, \u201cGeneral framework for single event effects rate prediction in microelectronics,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a056, no.\u00a06, pp. 3098–3108, Dec. 2009.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>16]<\/td>\nJ.\u00a0A. Pellish, M.\u00a0A. Xapsos, K.\u00a0A. LaBel, P.\u00a0W. Marshall, D.\u00a0F. Heidel, K.\u00a0P. Rodbell, M.\u00a0C. Hakey, P.\u00a0E. Dodd, M.\u00a0R. Shaneyfelt, J.\u00a0R. Schwank, R.\u00a0C. Baumann, X.\u00a0Deng, A.\u00a0Marshall, B.\u00a0D. Sierawski<\/u>, J.\u00a0D. Black, R.\u00a0A. Reed, R.\u00a0D. Schrimpf, H.\u00a0S. Kim, M.\u00a0D. Berg, M.\u00a0J. Campola, M.\u00a0R. Friendlich, C.\u00a0E. Perez, A.\u00a0M. Phan, and C.\u00a0M. Seidleck, \u201cHeavy ion testing at the galactic cosmic ray energy peak,\u201d in Proc. of the Conf. on Rad. Effects. on Comp. and Sys.<\/em>, Sep. 2009, pp. 559–562.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>15]<\/td>\nC.\u00a0L. Howe, R.\u00a0A. Weller, R.\u00a0A. Reed, B.\u00a0D. Sierawski<\/u>, P.\u00a0W. Marshall, C.\u00a0J. Marshall, M.\u00a0H. Mendenhall, R.\u00a0D. Schrimpf, and J.\u00a0E. Hubbs, \u201cEffects of surrounding materials on proton-induced energy deposition in large silicon diode arrays,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a056, no.\u00a04, pp. 2167–2170, Aug. 2009.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>14]<\/td>\nM.\u00a0E. Porter, J.\u00a0E. Wilkinson, K.\u00a0Walsh, B.\u00a0D. Sierawski<\/u>, K.\u00a0M. Warren, R.\u00a0A. Reed, and G.\u00a0Vizkelethy, \u201cSoft error reliability improvements for implantable medical devices,\u201d in Proc. of the Int. Rel. Physics Symp.<\/em>, Apr. 2008, pp. 488–491.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>13]<\/td>\nK.\u00a0M. Warren, J.\u00a0D. Wilkinson, R.\u00a0A. Weller, B.\u00a0D. Sierawski<\/u>, R.\u00a0A. Reed, M.\u00a0E. Porter, M.\u00a0H. Mendenhall, R.\u00a0D. Schrimpf, and L.\u00a0W. Massengill, \u201cPredicting neutron induced soft error rates: Evaluation of accelerated ground based test methods,\u201d in Proc. of the Int. Rel. Physics Symp.<\/em>, Apr. 2008, pp. 473–477.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>12]<\/td>\nC.\u00a0L. Howe, R.\u00a0A. Weller, R.\u00a0A. Reed, B.\u00a0D. Sierawski<\/u>, P.\u00a0W. Marshall, C.\u00a0J. Marshall, M.\u00a0H. Mendenhall, R.\u00a0D. Schrimpf, and J.\u00a0E. Hubbs, \u201cDistribution of proton-induced transients in silicon focal plane arrays,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a054, no.\u00a06, pp. 2444–2449, Dec. 2007.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>11]<\/td>\nJ.\u00a0A. Pellish, R.\u00a0A. Reed, A.\u00a0K. Sutton, R.\u00a0A. Weller, M.\u00a0A. Carts, P.\u00a0W. Marshall, C.\u00a0J. Marshall, R.\u00a0Krithivasan, J.\u00a0D. Cressler, M.\u00a0H. Mendenhall, R.\u00a0D. Schrimpf, K.\u00a0M. Warren, B.\u00a0D. Sierawski<\/u>, and G.\u00a0Niu, \u201cA generalized SiGe HBT single-event effects model for on-orbit event rate calculations,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a054, no.\u00a06, pp. 2322–2329, Dec. 2007.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>10]<\/td>\nR.\u00a0A. Reed, R.\u00a0A. Weller, M.\u00a0H. Mendenhall, J.-M. Lauenstein, K.\u00a0M. Warren, J.\u00a0A. Pellish, R.\u00a0D. Schrimpf, B.\u00a0D. Sierawski<\/u>, L.\u00a0W. Massengill, P.\u00a0E. Dodd, M.\u00a0R. Shaneyfelt, J.\u00a0A. Felix, J.\u00a0Schwank, N.\u00a0F. Haddad, R.\u00a0K. Lawrence, J.\u00a0H. Bowman, and R.\u00a0Conde, \u201cImpact of ion energy and species on single event effects analysis,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a054, no.\u00a06, pp. 2312–2321, Dec. 2007.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>9]<\/td>\nK.\u00a0M. Warren, B.\u00a0D. Sierawski<\/u>, R.\u00a0A. Reed, R.\u00a0A. Weller, C.\u00a0Carmichael, J.\u00a0D. Jong, A.\u00a0Lesea, M.\u00a0H. Mendenhall, R.\u00a0D. Schrimpf, L.\u00a0W. Massengill, T.\u00a0Hoang, H.\u00a0Wan, R.\u00a0Padovani, and J.\u00a0Fabula, \u201cMonte-carlo based on-orbit single event upset rate prediction for a radiation hardened by design latch,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a054, no.\u00a06, pp. 2419–2425, Dec. 2007.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>8]<\/td>\nR.\u00a0A. Reed, G.\u00a0Vizkelethy, J.\u00a0A. Pellish, B.\u00a0D. Sierawski<\/u>, K.\u00a0M. Warren, M.\u00a0Porter, J.\u00a0Wilinson, P.\u00a0W. Marshall, G.\u00a0Niu, J.\u00a0D. Cressler, R.\u00a0D. Schrimpf, A.\u00a0Tipton, and R.\u00a0A. Weller, \u201cApplications of heavy ion microprobe for single event effects analysis,\u201d Nucl. Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms<\/em>, vol. 261, pp. 443–446, Aug. 2007.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>7]<\/td>\nK.\u00a0M. Warren, R.\u00a0A. Weller, B.\u00a0D. Sierawski<\/u>, R.\u00a0A. Reed, M.\u00a0H. Mendenhall, R.\u00a0D. Schrimpf, L.\u00a0W. Massengill, M.\u00a0E. Porter, J.\u00a0D. Wilkerson, K.\u00a0A. LaBel, and J.\u00a0Adams, \u201cApplication of RADSAFE to model single event upset response of a 0.25um CMOS SRAM,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a054, no.\u00a04, pp. 898–903, Aug. 2007.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>6]<\/td>\nK.\u00a0M. Warren, B.\u00a0D. Sierawski<\/u>, R.\u00a0A. Weller, R.\u00a0A. Reed, M.\u00a0H. Mendenhall, J.\u00a0A. Pellish, R.\u00a0D. Schrimpf, L.\u00a0W. Massengill, M.\u00a0E. Porter, and J.\u00a0D. Wilkinson, \u201cPredicting thermal neutron-induced soft errors in static memories using TCAD and physics-based monte carlo simulation tools,\u201d IEEE Electron Device Lett.<\/em>, vol.\u00a028, no.\u00a02, pp. 180–182, Feb. 2007.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>5]<\/td>\nB.\u00a0D. Sierawski<\/u>, B.\u00a0L. Bhuva, and L.\u00a0W. Massengill, \u201cReducing soft error rate in logic circuits through approximate logic functions,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a053, no.\u00a06, pp. 3417–3421, Dec. 2006.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>4]<\/td>\nA.\u00a0D. Tipton, J.\u00a0A. Pellish, R.\u00a0A. Reed, M.\u00a0H.\u00a0M. Ronald D.\u00a0Schrimpf, Robert A.\u00a0Weller, B.\u00a0D. Sierawski<\/u>, A.\u00a0K. Sutton, G.\u00a0E. R.\u00a0M.\u00a0Diestelhorst, J.\u00a0D. Cressler, P.\u00a0W. Marshall, and G.\u00a0Vizkelethy, \u201cMultiple-bit upset in a 130nm CMOS technology,\u201d IEEE Trans. Nucl. Sci.<\/em>, vol.\u00a053, no.\u00a06, pp. 3259–3264, Dec. 2006.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>3]<\/td>\nF.\u00a0A. Aloul, B.\u00a0D. Sierawski<\/u>, and K.\u00a0A. Sakallah, \u201cSatometer: How much have we searched?\u201d IEEE Trans. Comput.-Aided Design Integr. Circuits Syst.<\/em>, vol.\u00a022, no.\u00a08, pp. 995–1004, Aug. 2003.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>2]<\/td>\n——, \u201cSatometer: How much have we searched?\u201d in Proc. of the Design Automation Conf.<\/em> New York, NY: ACM Press, Jun. 2002, pp. 737–742.[\u00a0bib<\/a>\u00a0| DOI<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>1]<\/td>\n——, \u201cA tool for measuring progress of backtrack search solvers,\u201d in Proc. of the Symp. on the Theory and Applications of Satisfiability Testing<\/em>, May 2002, pp. 98–105.[\u00a0bib<\/a>\u00a0]<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

Non-reviewed<\/h3>\n\n\n\n\n\n\n\n\n\n\n\n\n
[<\/a>10]<\/td>\nC.\u00a0T. Toomey, B.\u00a0D. Sierawski<\/u>, A.\u00a0Sternberg, D.\u00a0B. Limbrick, B.\u00a0L. Bhuva, L.\u00a0W. Massengill, W.\u00a0H. Robison, S.-J. Wen, R.\u00a0Wong, and S.\u00a0Martin, \u201cStatistical fault injection and analysis at the register transfer level using the verilog procedural interface.\u201d Government Microcircuit Applications and Critical Technology Conference, Mar. 2011.[\u00a0bib<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>9]<\/td>\nB.\u00a0D. Sierawski<\/u>, M.\u00a0H. Mendenhall, R.\u00a0A. Weller, R.\u00a0A. Reed, J.\u00a0H. Adams, J.\u00a0W. Watts, and A.\u00a0F. Barghouty, \u201cCreme-mc: A physics-based single event effects tool.\u201d IEEE Nuclear Science Symposium, Nov. 2010.[\u00a0bib<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>8]<\/td>\nR.\u00a0A. Weller, M.\u00a0H. Mendenhall, R.\u00a0A. Reed, K.\u00a0M. Warren, B.\u00a0D. Sierawski<\/u>, R.\u00a0D. Schrimpf, L.\u00a0W. Massengill, and M.\u00a0Asai, \u201cMonte carlo simulation of radiation effects in microelectronics.\u201d IEEE Nuclear Science Symposium, Nov. 2010.[\u00a0bib<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>7]<\/td>\nK.\u00a0M. Warren, J.\u00a0D. Wilkinson, S.\u00a0Morrison, M.\u00a0E. Porter, R.\u00a0A. Weller, B.\u00a0D. Sierawski, M.\u00a0H. Mendenhall, J.\u00a0A. Pellish, R.\u00a0D. Schrimpf, and L.\u00a0W. Massengill, \u201cModeling alpha and neutron induced soft errors in static random access memories using radsafe.\u201d Int. Conf. IC Design & Technology (ICICDT), May 2007.[\u00a0bib<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>6]<\/td>\nJ.\u00a0D. Wilkinson, M.\u00a0E. Porter, S.\u00a0Morrison, R.\u00a0A. Reed, B.\u00a0D. Sierawski<\/u>, K.\u00a0M. Warren, R.\u00a0A. Weller, and M.\u00a0H. Mendenhall, \u201cIon microprobe measurements of sensitive volumes in a 0.25um cmos flip-flop.\u201d Silicon Errors in Logic – System Effects (SELSE), Apr. 2007.[\u00a0bib<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>5]<\/td>\nM.\u00a0L. Alles, R.\u00a0A. Reed, A.\u00a0N. Kalavagunta, B.\u00a0D. Sierawski<\/u>, J.\u00a0A. Pellish, E.\u00a0Montes, B.\u00a0Blalock, L.\u00a0Peltz, J.\u00a0Cressler, P.\u00a0W. Marshall, and G.\u00a0Niu, \u201cImplications of cold temperature environments for single event radiation effects.\u201d Government Microcircuit Applications & Critical Technology (GOMAC), Mar. 2007.[\u00a0bib<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>4]<\/td>\nR.\u00a0A. Weller, R.\u00a0A. Reed, M.\u00a0H. Mendenhall, K.\u00a0M. Warren, D.\u00a0R. Ball, J.\u00a0A. Pellish, B.\u00a0D. Sierawski<\/u>, C.\u00a0L. Howe, A.\u00a0D. Tipton, R.\u00a0D. Schrimpf, L.\u00a0W. Massengill, M.\u00a0Alles, A.\u00a0L. Sternberg, A.\u00a0F. Witulski, B.\u00a0E. Templeton, M.\u00a0A. Xapsos, K.\u00a0A. LaBel, J.\u00a0H. Adams, , and J.\u00a0W. Watts, \u201cGeant4 and the vanderbilt radiation effects simulation strategy,\u201d Nov. 2006, presented at the Geant4 Space Users’ Workshop.[\u00a0bib<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>3]<\/td>\nR.\u00a0A. Reed, R.\u00a0A. Weller, R.\u00a0D. Schrimpf, L.\u00a0W. Massengill, M.\u00a0H. Mendenhall, B.\u00a0D. Sierawski<\/u>, K.\u00a0M. Warren, D.\u00a0R. Ball, M.\u00a0Alles, A.\u00a0Sternberg, J.\u00a0A. Pellish, and C.\u00a0Howe, \u201cApplications of radsafe,\u201d Mar. 2006, presented at the Geant4 Space Users’ Meeting, SLAC.[\u00a0bib<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>2]<\/td>\nR.\u00a0A. Weller, M.\u00a0H. Mendenhall, R.\u00a0A. Reed, J.\u00a0A. Pellish, B.\u00a0D. Sierawski<\/u>, L.\u00a0W. Massengill, and R.\u00a0D. Schrimpf, \u201cMred8 — a python controlled geant4 application for space radiation effects,\u201d Mar. 2006, presented at the Geant4 Space Users’ Meeting.[\u00a0bib<\/a>\u00a0]<\/td>\n<\/tr>\n
[<\/a>1]<\/td>\nR.\u00a0A. Reed, R.\u00a0A. Weller, R.\u00a0D. Schrimpf, L.\u00a0W. Massengill, M.\u00a0H. Mendenhall, K.\u00a0M. Warren, B.\u00a0D. Sierawski<\/u>, D.\u00a0R. Ball, M.\u00a0Alles, A.\u00a0Sternberg, J.\u00a0A. Pellish, C.\u00a0L. Howe, A.\u00a0D. Tipton, K.\u00a0A. LaBel, , and M.\u00a0Xapsos, \u201cApplications of radsafe for single event effects analysis,\u201d Nov. 2005, presented at the Geant4 Space Users’ Workshop.[\u00a0bib<\/a>\u00a0]<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Reviewed [47] E.\u00a0B. Pitt, E.\u00a0J. Barth, Z.\u00a0J. Diggins, N.\u00a0Mahadevan, G.\u00a0Karsai, B.\u00a0D. Sierawski, R.\u00a0A. Reed, R.\u00a0D. Schrimpf, R.\u00a0A. Weller, M.\u00a0L. Alles, and A.\u00a0F. Witulski, \u201cRadiation response and adaptive control-based degradation mitigation of mems accelerometers in ionizing dose environments,\u201d IEEE Sensors J., vol.\u00a017, no.\u00a04, pp. 1132–1143, Feb. 2017.[\u00a0bib\u00a0| DOI\u00a0] [46] J.\u00a0M. Trippe, R.\u00a0A. Reed, B.\u00a0D. Sierawski, R.\u00a0A….<\/p>\n","protected":false},"author":148,"featured_media":0,"parent":0,"menu_order":2,"comment_status":"open","ping_status":"open","template":"","meta":{"footnotes":""},"tags":[],"class_list":["post-6","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/my.dev.vanderbilt.edu\/briansierawski\/wp-json\/wp\/v2\/pages\/6","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/my.dev.vanderbilt.edu\/briansierawski\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/my.dev.vanderbilt.edu\/briansierawski\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/my.dev.vanderbilt.edu\/briansierawski\/wp-json\/wp\/v2\/users\/148"}],"replies":[{"embeddable":true,"href":"https:\/\/my.dev.vanderbilt.edu\/briansierawski\/wp-json\/wp\/v2\/comments?post=6"}],"version-history":[{"count":18,"href":"https:\/\/my.dev.vanderbilt.edu\/briansierawski\/wp-json\/wp\/v2\/pages\/6\/revisions"}],"predecessor-version":[{"id":224,"href":"https:\/\/my.dev.vanderbilt.edu\/briansierawski\/wp-json\/wp\/v2\/pages\/6\/revisions\/224"}],"wp:attachment":[{"href":"https:\/\/my.dev.vanderbilt.edu\/briansierawski\/wp-json\/wp\/v2\/media?parent=6"}],"wp:term":[{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/my.dev.vanderbilt.edu\/briansierawski\/wp-json\/wp\/v2\/tags?post=6"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}